Articles | Volume 8, issue 1
https://doi.org/10.5194/gi-8-97-2019
https://doi.org/10.5194/gi-8-97-2019
Research article
 | 
14 Mar 2019
Research article |  | 14 Mar 2019

Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy

Dorothea S. Macholdt, Jan-David Förster, Maren Müller, Bettina Weber, Michael Kappl, A. L. David Kilcoyne, Markus Weigand, Jan Leitner, Klaus Peter Jochum, Christopher Pöhlker, and Meinrat O. Andreae

Viewed

Total article views: 3,300 (including HTML, PDF, and XML)
HTML PDF XML Total BibTeX EndNote
2,290 919 91 3,300 76 93
  • HTML: 2,290
  • PDF: 919
  • XML: 91
  • Total: 3,300
  • BibTeX: 76
  • EndNote: 93
Views and downloads (calculated since 29 Jun 2018)
Cumulative views and downloads (calculated since 29 Jun 2018)

Viewed (geographical distribution)

Total article views: 3,300 (including HTML, PDF, and XML) Thereof 2,777 with geography defined and 523 with unknown origin.
Country # Views %
  • 1
1
 
 
 
 

Cited

Latest update: 27 Mar 2024
Download
Short summary
Focused ion beam (FIB) slicing is a widely used technique to prepare ultrathin slices for the microanalysis of geological and environmental samples. During our investigations of the manganese oxidation states in rock varnish slices, we found an FIB-related reduction of manganese(IV) to manganese(II) at the samples’ surfaces. This study characterizes the observed reduction artifacts and emphasizes that caution is needed in the analysis of transition metal oxidation states upon FIB preparation.